Articles | Volume 10, issue 11
https://doi.org/10.5194/amt-10-4373-2017
https://doi.org/10.5194/amt-10-4373-2017
Research article
 | 
15 Nov 2017
Research article |  | 15 Nov 2017

Characterization and correction of OMPS nadir mapper measurements for ozone profile retrievals

Juseon Bak, Xiong Liu, Jae-Hwan Kim, David P. Haffner, Kelly Chance, Kai Yang, and Kang Sun

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Cited articles

Bak, J., Kim, J. H., Liu, X., Chance, K., and Kim, J.: Evaluation of ozone profile and tropospheric ozone retrievals from GEMS and OMI spectra, Atmos. Meas. Tech., 6, 239–249, https://doi.org/10.5194/amt-6-239-2013, 2013a.
Bak, J., Libaku, X., Wei, J. C., Pan, L. L., Chance, K., and Kim, J. H.: Improvement of OMI ozone profile retrievals in the upper troposphere and lower stratosphere by the use of a tropopause-based ozone profile climatology, Atmos. Meas. Tech., 6, 2239–2254, https://doi.org/10.5194/amt-6-2239-2013, 2013b.
Bak, J., Liu, X., Kim, J. H., Chance, K., and Haffner, D. P.: Validation of OMI total ozone retrievals from the SAO ozone profile algorithm and three operational algorithms with Brewer measurements, Atmos. Chem. Phys., 15, 667–683, https://doi.org/10.5194/acp-15-667-2015, 2015.
Beirle, S., Lampel, J., Lerot, C., Sihler, H., and Wagner, T.: Parameterizing the instrumental spectral response function and its changes by a super-Gaussian and its derivatives, Atmos. Meas. Tech., 10, 581–598, https://doi.org/10.5194/amt-10-581-2017, 2017.
Bhartia, P. K. and Wellemeyer, C.: TOMS-V8 total O3 algorithm, in: OMI Algorithm Theoretical Basis Document, Vol. II, OMI Ozone Products, edited by: Bhartia, P. K., NASA Goddard Space Flight Cent., Greenbelt, MD, 15–31, 2002.
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Short summary
This paper verifies and corrects the Ozone Mapping and Profiler Suite (OMPS) nadir mapper (NM) level 1B v2.0 measurements to retrieve reliable ozone profile and tropospheric ozone using an optimal estimation inversion with the fitting window of 302.5–340 nm. We apply "soft calibration" and "common mode correction" to OMPS radiances to eliminate systematic errors in the fitting residuals and derive random-noise measurement errors accounting for both OMPS radiances and forward model calculation.