Articles | Volume 6, issue 5
https://doi.org/10.5194/amt-6-1171-2013
© Author(s) 2013. This work is distributed under the Creative Commons Attribution 3.0 License.
Research article
| 
07 May 2013
Research article |
| 07 May 2013
Biases caused by the instrument bandwidth and beam width on simulated brightness temperature measurements from scanning microwave radiometers
Download
- Final revised paper (published on 07 May 2013)
- Preprint (discussion started on 01 Nov 2012)
Interactive discussion
AC: Author comment | RC: Referee comment | SC: Short comment | EC: Editor comment
- Printer-friendly version
- Supplement
-
RC C3192: 'Comments to Manuscript amt-2012-202', Anonymous Referee #1, 10 Dec 2012
-
AC C4014: 'Final response to reviewer 1 of AMT-2012-202', Véronique Meunier, 25 Feb 2013
-
AC C4014: 'Final response to reviewer 1 of AMT-2012-202', Véronique Meunier, 25 Feb 2013
-
RC C3556: 'Review amt-2012-202 by V. Meunier et al.', Anonymous Referee #2, 14 Jan 2013
-
AC C4012: 'Final response to reviewer 2 of AMT-2012-202', Véronique Meunier, 25 Feb 2013
-
AC C4012: 'Final response to reviewer 2 of AMT-2012-202', Véronique Meunier, 25 Feb 2013
