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Atmospheric Measurement Techniques
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IF 3.248
CiteScore 3.37
SNIP 1.253
SJR 1.869
h5-index 47
Abstracted/indexed
Abstracted/indexed
Volume 6, issue 2
Atmos. Meas. Tech., 6, 371-386, 2013
https://doi.org/10.5194/amt-6-371-2013
© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.
https://doi.org/10.5194/amt-6-371-2013
© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.
Special issue: GOME-2: calibration, algorithms, data products and...
Atmos. Meas. Tech., 6, 371-386, 2013
https://doi.org/10.5194/amt-6-371-2013
© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.
https://doi.org/10.5194/amt-6-371-2013
© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.
Research article 18 Feb 2013
Research article | 18 Feb 2013
Characterisation of GOME-2 formaldehyde retrieval sensitivity
W. Hewson et al.Related authors
No articles found.
Yang Wang, Steffen Dörner, Sebastian Donner, Sebastian Böhnke, Isabelle De Smedt, Russell R. Dickerson, Zipeng Dong, Hao He, Zhanqing Li, Zhengqiang Li, Donghui Li, Dong Liu, Xinrong Ren, Nicolas Theys, Yuying Wang, Yang Wang, Zhenzhu Wang, Hua Xu, Jiwei Xu, and Thomas Wagner
Atmos. Chem. Phys. Discuss., https://doi.org/10.5194/acp-2018-1137, https://doi.org/10.5194/acp-2018-1137, 2018
Manuscript under review for ACP
Short summary
Hansen Cao, Tzung-May Fu, Lin Zhang, Daven K. Henze, Christopher Chan Miller, Christophe Lerot, Gonzalo González Abad, Isabelle De Smedt, Qiang Zhang, Michel van Roozendael, François Hendrick, Kelly Chance, Jie Li, Junyu Zheng, and Yuanhong Zhao
Atmos. Chem. Phys., 18, 15017-15046, https://doi.org/10.5194/acp-18-15017-2018, https://doi.org/10.5194/acp-18-15017-2018, 2018
Short summary
Neil Humpage, Hartmut Boesch, Paul I. Palmer, Andy Vick, Phil Parr-Burman, Martyn Wells, David Pearson, Jonathan Strachan, and Naidu Bezawada
Atmos. Meas. Tech., 11, 5199-5222, https://doi.org/10.5194/amt-11-5199-2018, https://doi.org/10.5194/amt-11-5199-2018, 2018
Short summary
K. Folkert Boersma, Henk J. Eskes, Andreas Richter, Isabelle De Smedt, Alba Lorente, Steffen Beirle, Jos H. G. M. van Geffen, Marina Zara, Enno Peters, Michel Van Roozendael, Thomas Wagner, Joannes D. Maasakkers, Ronald J. van der A, Joanne Nightingale, Anne De Rudder, Hitoshi Irie, Gaia Pinardi, Jean-Christopher Lambert, and Steven Compernolle
Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-200, https://doi.org/10.5194/amt-2018-200, 2018
Revised manuscript accepted for AMT
Short summary
Song Liu, Pieter Valks, Gaia Pinardi, Isabelle De Smedt, Huan Yu, Steffen Beirle, and Andreas Richter
Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-235, https://doi.org/10.5194/amt-2018-235, 2018
Revised manuscript under review for AMT
Short summary
Marina Zara, K. Folkert Boersma, Isabelle De Smedt, Andreas Richter, Enno Peters, Jos H. G. M. van Geffen, Steffen Beirle, Thomas Wagner, Michel Van Roozendael, Sergey Marchenko, Lok N. Lamsal, and Henk J. Eskes
Atmos. Meas. Tech., 11, 4033-4058, https://doi.org/10.5194/amt-11-4033-2018, https://doi.org/10.5194/amt-11-4033-2018, 2018
Short summary
Isabelle De Smedt, Nicolas Theys, Huan Yu, Thomas Danckaert, Christophe Lerot, Steven Compernolle, Michel Van Roozendael, Andreas Richter, Andreas Hilboll, Enno Peters, Mattia Pedergnana, Diego Loyola, Steffen Beirle, Thomas Wagner, Henk Eskes, Jos van Geffen, Klaas Folkert Boersma, and Pepijn Veefkind
Atmos. Meas. Tech., 11, 2395-2426, https://doi.org/10.5194/amt-11-2395-2018, https://doi.org/10.5194/amt-11-2395-2018, 2018
Short summary
Hannah Sonderfeld, Hartmut Bösch, Antoine P. R. Jeanjean, Stuart N. Riddick, Grant Allen, Sébastien Ars, Stewart Davies, Neil Harris, Neil Humpage, Roland Leigh, and Joseph Pitt
Atmos. Meas. Tech., 10, 3931-3946, https://doi.org/10.5194/amt-10-3931-2017, https://doi.org/10.5194/amt-10-3931-2017, 2017
Short summary
Yang Wang, Steffen Beirle, Johannes Lampel, Mariliza Koukouli, Isabelle De Smedt, Nicolas Theys, Ang Li, Dexia Wu, Pinhua Xie, Cheng Liu, Michel Van Roozendael, Trissevgeni Stavrakou, Jean-François Müller, and Thomas Wagner
Atmos. Chem. Phys., 17, 5007-5033, https://doi.org/10.5194/acp-17-5007-2017, https://doi.org/10.5194/acp-17-5007-2017, 2017
Short summary
Michael P. Barkley, Gonzalo González Abad, Thomas P. Kurosu, Robert Spurr, Sara Torbatian, and Christophe Lerot
Atmos. Chem. Phys., 17, 4687-4709, https://doi.org/10.5194/acp-17-4687-2017, https://doi.org/10.5194/acp-17-4687-2017, 2017
Short summary
Alba Lorente, K. Folkert Boersma, Huan Yu, Steffen Dörner, Andreas Hilboll, Andreas Richter, Mengyao Liu, Lok N. Lamsal, Michael Barkley, Isabelle De Smedt, Michel Van Roozendael, Yang Wang, Thomas Wagner, Steffen Beirle, Jin-Tai Lin, Nickolay Krotkov, Piet Stammes, Ping Wang, Henk J. Eskes, and Maarten Krol
Atmos. Meas. Tech., 10, 759-782, https://doi.org/10.5194/amt-10-759-2017, https://doi.org/10.5194/amt-10-759-2017, 2017
Short summary
Clio Gielen, François Hendrick, Gaia Pinardi, Isabelle De Smedt, Caroline Fayt, Christian Hermans, Trissevgeni Stavrakou, Maite Bauwens, Jean-Francois Müller, Eugène Ndenzako, Pierre Nzohabonayo, Rachel Akimana, Sebastien Niyonzima, Michel Van Roozendael, and Martine De Mazière
Atmos. Chem. Phys. Discuss., https://doi.org/10.5194/acp-2016-1104, https://doi.org/10.5194/acp-2016-1104, 2017
Revised manuscript has not been submitted
Short summary
Lei Zhu, Daniel J. Jacob, Patrick S. Kim, Jenny A. Fisher, Karen Yu, Katherine R. Travis, Loretta J. Mickley, Robert M. Yantosca, Melissa P. Sulprizio, Isabelle De Smedt, Gonzalo González Abad, Kelly Chance, Can Li, Richard Ferrare, Alan Fried, Johnathan W. Hair, Thomas F. Hanisco, Dirk Richter, Amy Jo Scarino, James Walega, Petter Weibring, and Glenn M. Wolfe
Atmos. Chem. Phys., 16, 13477-13490, https://doi.org/10.5194/acp-16-13477-2016, https://doi.org/10.5194/acp-16-13477-2016, 2016
Short summary
Robert J. Parker, Hartmut Boesch, Martin J. Wooster, David P. Moore, Alex J. Webb, David Gaveau, and Daniel Murdiyarso
Atmos. Chem. Phys., 16, 10111-10131, https://doi.org/10.5194/acp-16-10111-2016, https://doi.org/10.5194/acp-16-10111-2016, 2016
Short summary
R. J. Parker, H. Boesch, K. Byckling, A. J. Webb, P. I. Palmer, L. Feng, P. Bergamaschi, F. Chevallier, J. Notholt, N. Deutscher, T. Warneke, F. Hase, R. Sussmann, S. Kawakami, R. Kivi, D. W. T. Griffith, and V. Velazco
Atmos. Meas. Tech., 8, 4785-4801, https://doi.org/10.5194/amt-8-4785-2015, https://doi.org/10.5194/amt-8-4785-2015, 2015
Short summary
I. De Smedt, T. Stavrakou, F. Hendrick, T. Danckaert, T. Vlemmix, G. Pinardi, N. Theys, C. Lerot, C. Gielen, C. Vigouroux, C. Hermans, C. Fayt, P. Veefkind, J.-F. Müller, and M. Van Roozendael
Atmos. Chem. Phys., 15, 12519-12545, https://doi.org/10.5194/acp-15-12519-2015, https://doi.org/10.5194/acp-15-12519-2015, 2015
Short summary
T. Stavrakou, J.-F. Müller, M. Bauwens, I. De Smedt, M. Van Roozendael, M. De Mazière, C. Vigouroux, F. Hendrick, M. George, C. Clerbaux, P.-F. Coheur, and A. Guenther
Atmos. Chem. Phys., 15, 11861-11884, https://doi.org/10.5194/acp-15-11861-2015, https://doi.org/10.5194/acp-15-11861-2015, 2015
Short summary
W. Hewson, M. P. Barkley, G. Gonzalez Abad, H. Bösch, T. Kurosu, R. Spurr, and L. G. Tilstra
Atmos. Meas. Tech., 8, 4055-4074, https://doi.org/10.5194/amt-8-4055-2015, https://doi.org/10.5194/amt-8-4055-2015, 2015
Short summary
Y. Zheng, N. Unger, M. P. Barkley, and X. Yue
Atmos. Chem. Phys., 15, 8559-8576, https://doi.org/10.5194/acp-15-8559-2015, https://doi.org/10.5194/acp-15-8559-2015, 2015
Short summary
J. H. G. M. van Geffen, K. F. Boersma, M. Van Roozendael, F. Hendrick, E. Mahieu, I. De Smedt, M. Sneep, and J. P. Veefkind
Atmos. Meas. Tech., 8, 1685-1699, https://doi.org/10.5194/amt-8-1685-2015, https://doi.org/10.5194/amt-8-1685-2015, 2015
Short summary
T. Vlemmix, F. Hendrick, G. Pinardi, I. De Smedt, C. Fayt, C. Hermans, A. Piters, P. Wang, P. Levelt, and M. Van Roozendael
Atmos. Meas. Tech., 8, 941-963, https://doi.org/10.5194/amt-8-941-2015, https://doi.org/10.5194/amt-8-941-2015, 2015
Short summary
A. Geddes and H. Bösch
Atmos. Meas. Tech., 8, 859-874, https://doi.org/10.5194/amt-8-859-2015, https://doi.org/10.5194/amt-8-859-2015, 2015
H. Boesch, N. M. Deutscher, T. Warneke, K. Byckling, A. J. Cogan, D. W. T. Griffith, J. Notholt, R. J. Parker, and Z. Wang
Atmos. Meas. Tech., 6, 599-612, https://doi.org/10.5194/amt-6-599-2013, https://doi.org/10.5194/amt-6-599-2013, 2013
Related subject area
Subject: Gases | Technique: Remote Sensing | Topic: Validation and Intercomparisons
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Atmos. Meas. Tech., 11, 721-739, https://doi.org/10.5194/amt-11-721-2018, https://doi.org/10.5194/amt-11-721-2018, 2018
Jay Herman, Liang Huang, Richard McPeters, Jerry Ziemke, Alexander Cede, and Karin Blank
Atmos. Meas. Tech., 11, 177-194, https://doi.org/10.5194/amt-11-177-2018, https://doi.org/10.5194/amt-11-177-2018, 2018
Short summary
Monica Campanelli, Alessandra Mascitelli, Paolo Sanò, Henri Diémoz, Victor Estellés, Stefano Federico, Anna Maria Iannarelli, Francesca Fratarcangeli, Augusto Mazzoni, Eugenio Realini, Mattia Crespi, Olivier Bock, Jose A. Martínez-Lozano, and Stefano Dietrich
Atmos. Meas. Tech., 11, 81-94, https://doi.org/10.5194/amt-11-81-2018, https://doi.org/10.5194/amt-11-81-2018, 2018
Short summary
Guanyu Huang, Xiong Liu, Kelly Chance, Kai Yang, and Zhaonan Cai
Atmos. Meas. Tech., 11, 17-32, https://doi.org/10.5194/amt-11-17-2018, https://doi.org/10.5194/amt-11-17-2018, 2018
Short summary
Takafumi Sugita, Hideharu Akiyoshi, Elián Wolfram, Jacobo Salvador, Hirofumi Ohyama, and Akira Mizuno
Atmos. Meas. Tech., 10, 4947-4964, https://doi.org/10.5194/amt-10-4947-2017, https://doi.org/10.5194/amt-10-4947-2017, 2017
Short summary
Yana A. Virolainen, Yury M. Timofeyev, Vladimir S. Kostsov, Dmitry V. Ionov, Vladislav V. Kalinnikov, Maria V. Makarova, Anatoly V. Poberovsky, Nikita A. Zaitsev, Hamud H. Imhasin, Alexander V. Polyakov, Matthias Schneider, Frank Hase, Sabine Barthlott, and Thomas Blumenstock
Atmos. Meas. Tech., 10, 4521-4536, https://doi.org/10.5194/amt-10-4521-2017, https://doi.org/10.5194/amt-10-4521-2017, 2017
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René Stübi, Herbert Schill, Jörg Klausen, Laurent Vuilleumier, Julian Gröbner, Luca Egli, and Dominique Ruffieux
Atmos. Meas. Tech., 10, 4479-4490, https://doi.org/10.5194/amt-10-4479-2017, https://doi.org/10.5194/amt-10-4479-2017, 2017
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Travis N. Knepp, Richard Querel, Paul Johnston, Larry Thomason, David Flittner, and Joseph M. Zawodny
Atmos. Meas. Tech., 10, 4363-4372, https://doi.org/10.5194/amt-10-4363-2017, https://doi.org/10.5194/amt-10-4363-2017, 2017
Short summary
Maria Filioglou, Anna Nikandrova, Sami Niemelä, Holger Baars, Tero Mielonen, Ari Leskinen, David Brus, Sami Romakkaniemi, Elina Giannakaki, and Mika Komppula
Atmos. Meas. Tech., 10, 4303-4316, https://doi.org/10.5194/amt-10-4303-2017, https://doi.org/10.5194/amt-10-4303-2017, 2017
Augustinus J. C. Berkhout, Daan P. J. Swart, Hester Volten, Lou F. L. Gast, Marty Haaima, Hans Verboom, Guus Stefess, Theo Hafkenscheid, and Ronald Hoogerbrugge
Atmos. Meas. Tech., 10, 4099-4120, https://doi.org/10.5194/amt-10-4099-2017, https://doi.org/10.5194/amt-10-4099-2017, 2017
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Travis N. Knepp, James J. Szykman, Russell Long, Rachelle M. Duvall, Jonathan Krug, Melinda Beaver, Kevin Cavender, Keith Kronmiller, Michael Wheeler, Ruben Delgado, Raymond Hoff, Timothy Berkoff, Erik Olson, Richard Clark, Daniel Wolfe, David Van Gilst, and Doreen Neil
Atmos. Meas. Tech., 10, 3963-3983, https://doi.org/10.5194/amt-10-3963-2017, https://doi.org/10.5194/amt-10-3963-2017, 2017
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Naoko Saitoh, Shuhei Kimoto, Ryo Sugimura, Ryoichi Imasu, Kei Shiomi, Akihiko Kuze, Yosuke Niwa, Toshinobu Machida, Yousuke Sawa, and Hidekazu Matsueda
Atmos. Meas. Tech., 10, 3877-3892, https://doi.org/10.5194/amt-10-3877-2017, https://doi.org/10.5194/amt-10-3877-2017, 2017
Short summary
Lihua Wang, Michael J. Newchurch, Raul J. Alvarez II, Timothy A. Berkoff, Steven S. Brown, William Carrion, Russell J. De Young, Bryan J. Johnson, Rene Ganoe, Guillaume Gronoff, Guillaume Kirgis, Shi Kuang, Andrew O. Langford, Thierry Leblanc, Erin E. McDuffie, Thomas J. McGee, Denis Pliutau, Christoph J. Senff, John T. Sullivan, Grant Sumnicht, Laurence W. Twigg, and Andrew J. Weinheimer
Atmos. Meas. Tech., 10, 3865-3876, https://doi.org/10.5194/amt-10-3865-2017, https://doi.org/10.5194/amt-10-3865-2017, 2017
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Yang Wang, Steffen Beirle, Francois Hendrick, Andreas Hilboll, Junli Jin, Aleksandra A. Kyuberis, Johannes Lampel, Ang Li, Yuhan Luo, Lorenzo Lodi, Jianzhong Ma, Monica Navarro, Ivan Ortega, Enno Peters, Oleg L. Polyansky, Julia Remmers, Andreas Richter, Olga Puentedura, Michel Van Roozendael, André Seyler, Jonathan Tennyson, Rainer Volkamer, Pinhua Xie, Nikolai F. Zobov, and Thomas Wagner
Atmos. Meas. Tech., 10, 3719-3742, https://doi.org/10.5194/amt-10-3719-2017, https://doi.org/10.5194/amt-10-3719-2017, 2017
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Kevin S. Olsen, Kimberly Strong, Kaley A. Walker, Chris D. Boone, Piera Raspollini, Johannes Plieninger, Whitney Bader, Stephanie Conway, Michel Grutter, James W. Hannigan, Frank Hase, Nicholas Jones, Martine de Mazière, Justus Notholt, Matthias Schneider, Dan Smale, Ralf Sussmann, and Naoko Saitoh
Atmos. Meas. Tech., 10, 3697-3718, https://doi.org/10.5194/amt-10-3697-2017, https://doi.org/10.5194/amt-10-3697-2017, 2017
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Jiyoung Kim, Jhoon Kim, Hi-Ku Cho, Jay Herman, Sang Seo Park, Hyun Kwang Lim, Jae-Hwan Kim, Koji Miyagawa, and Yun Gon Lee
Atmos. Meas. Tech., 10, 3661-3676, https://doi.org/10.5194/amt-10-3661-2017, https://doi.org/10.5194/amt-10-3661-2017, 2017
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Jay Herman, Robert Evans, Alexander Cede, Nader Abuhassan, Irina Petropavlovskikh, Glenn McConville, Koji Miyagawa, and Brandon Noirot
Atmos. Meas. Tech., 10, 3539-3545, https://doi.org/10.5194/amt-10-3539-2017, https://doi.org/10.5194/amt-10-3539-2017, 2017
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Sven Krautwurst, Konstantin Gerilowski, Haflidi H. Jonsson, David R. Thompson, Richard W. Kolyer, Laura T. Iraci, Andrew K. Thorpe, Markus Horstjann, Michael Eastwood, Ira Leifer, Samuel A. Vigil, Thomas Krings, Jakob Borchardt, Michael Buchwitz, Matthew M. Fladeland, John P. Burrows, and Heinrich Bovensmann
Atmos. Meas. Tech., 10, 3429-3452, https://doi.org/10.5194/amt-10-3429-2017, https://doi.org/10.5194/amt-10-3429-2017, 2017
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Valentin Duflot, Jean-Luc Baray, Guillaume Payen, Nicolas Marquestaut, Francoise Posny, Jean-Marc Metzger, Bavo Langerock, Corinne Vigouroux, Juliette Hadji-Lazaro, Thierry Portafaix, Martine De Mazière, Pierre-Francois Coheur, Cathy Clerbaux, and Jean-Pierre Cammas
Atmos. Meas. Tech., 10, 3359-3373, https://doi.org/10.5194/amt-10-3359-2017, https://doi.org/10.5194/amt-10-3359-2017, 2017
Eleanor M. Waxman, Kevin C. Cossel, Gar-Wing Truong, Fabrizio R. Giorgetta, William C. Swann, Sean Coburn, Robert J. Wright, Gregory B. Rieker, Ian Coddington, and Nathan R. Newbury
Atmos. Meas. Tech., 10, 3295-3311, https://doi.org/10.5194/amt-10-3295-2017, https://doi.org/10.5194/amt-10-3295-2017, 2017
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Debora Griffin, Kaley A. Walker, Stephanie Conway, Felicia Kolonjari, Kimberly Strong, Rebecca Batchelor, Chris D. Boone, Lin Dan, James R. Drummond, Pierre F. Fogal, Dejian Fu, Rodica Lindenmaier, Gloria L. Manney, and Dan Weaver
Atmos. Meas. Tech., 10, 3273-3294, https://doi.org/10.5194/amt-10-3273-2017, https://doi.org/10.5194/amt-10-3273-2017, 2017
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Dan Weaver, Kimberly Strong, Matthias Schneider, Penny M. Rowe, Chris Sioris, Kaley A. Walker, Zen Mariani, Taneil Uttal, C. Thomas McElroy, Holger Vömel, Alessio Spassiani, and James R. Drummond
Atmos. Meas. Tech., 10, 2851-2880, https://doi.org/10.5194/amt-10-2851-2017, https://doi.org/10.5194/amt-10-2851-2017, 2017
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John R. Worden, Gary Doran, Susan Kulawik, Annmarie Eldering, David Crisp, Christian Frankenberg, Chris O'Dell, and Kevin Bowman
Atmos. Meas. Tech., 10, 2759-2771, https://doi.org/10.5194/amt-10-2759-2017, https://doi.org/10.5194/amt-10-2759-2017, 2017
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Eddy F. Plaza-Medina, Wolfgang Stremme, Alejandro Bezanilla, Michel Grutter, Matthias Schneider, Frank Hase, and Thomas Blumenstock
Atmos. Meas. Tech., 10, 2703-2725, https://doi.org/10.5194/amt-10-2703-2017, https://doi.org/10.5194/amt-10-2703-2017, 2017
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Wei Wang, Yuan Tian, Cheng Liu, Youwen Sun, Wenqing Liu, Pinhua Xie, Jianguo Liu, Jin Xu, Isamu Morino, Voltaire A. Velazco, David W. T. Griffith, Justus Notholt, and Thorsten Warneke
Atmos. Meas. Tech., 10, 2627-2643, https://doi.org/10.5194/amt-10-2627-2017, https://doi.org/10.5194/amt-10-2627-2017, 2017
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Enrico Dammers, Mark W. Shephard, Mathias Palm, Karen Cady-Pereira, Shannon Capps, Erik Lutsch, Kim Strong, James W. Hannigan, Ivan Ortega, Geoffrey C. Toon, Wolfgang Stremme, Michel Grutter, Nicholas Jones, Dan Smale, Jacob Siemons, Kevin Hrpcek, Denis Tremblay, Martijn Schaap, Justus Notholt, and Jan Willem Erisman
Atmos. Meas. Tech., 10, 2645-2667, https://doi.org/10.5194/amt-10-2645-2017, https://doi.org/10.5194/amt-10-2645-2017, 2017
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Merritt N. Deeter, David P. Edwards, Gene L. Francis, John C. Gille, Sara Martínez-Alonso, Helen M. Worden, and Colm Sweeney
Atmos. Meas. Tech., 10, 2533-2555, https://doi.org/10.5194/amt-10-2533-2017, https://doi.org/10.5194/amt-10-2533-2017, 2017
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Guanyu Huang, Xiong Liu, Kelly Chance, Kai Yang, Pawan K. Bhartia, Zhaonan Cai, Marc Allaart, Gérard Ancellet, Bertrand Calpini, Gerrie J. R. Coetzee, Emilio Cuevas-Agulló, Manuel Cupeiro, Hugo De Backer, Manvendra K. Dubey, Henry E. Fuelberg, Masatomo Fujiwara, Sophie Godin-Beekmann, Tristan J. Hall, Bryan Johnson, Everette Joseph, Rigel Kivi, Bogumil Kois, Ninong Komala, Gert König-Langlo, Giovanni Laneve, Thierry Leblanc, Marion Marchand, Kenneth R. Minschwaner, Gary Morris, Michael J. Newchurch, Shin-Ya Ogino, Nozomu Ohkawara, Ankie J. M. Piters, Françoise Posny, Richard Querel, Rinus Scheele, Frank J. Schmidlin, Russell C. Schnell, Otto Schrems, Henry Selkirk, Masato Shiotani, Pavla Skrivánková, René Stübi, Ghassan Taha, David W. Tarasick, Anne M. Thompson, Valérie Thouret, Matthew B. Tully, Roeland Van Malderen, Holger Vömel, Peter von der Gathen, Jacquelyn C. Witte, and Margarita Yela
Atmos. Meas. Tech., 10, 2455-2475, https://doi.org/10.5194/amt-10-2455-2017, https://doi.org/10.5194/amt-10-2455-2017, 2017
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Cited articles
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