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Atmospheric Measurement Techniques
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IF 3.248
CiteScore 3.37
SNIP 1.253
SJR 1.869
h5-index 47
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Volume 6, issue 2 |
Copyright
Atmos. Meas. Tech., 6, 371-386, 2013
https://doi.org/10.5194/amt-6-371-2013
© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.
https://doi.org/10.5194/amt-6-371-2013
© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.
Special issue: GOME-2: calibration, algorithms, data products and...
Atmos. Meas. Tech., 6, 371-386, 2013
https://doi.org/10.5194/amt-6-371-2013
© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.
https://doi.org/10.5194/amt-6-371-2013
© Author(s) 2013. This work is distributed under
the Creative Commons Attribution 3.0 License.
Research article 18 Feb 2013
Research article | 18 Feb 2013
Characterisation of GOME-2 formaldehyde retrieval sensitivity
W. Hewson et al.Related authors
No articles found.
Neil Humpage, Hartmut Boesch, Paul I. Palmer, Andy Vick, Phil Parr-Burman, Martyn Wells, David Pearson, Jonathan Strachan, and Naidu Bezawada
Atmos. Meas. Tech., 11, 5199-5222, https://doi.org/10.5194/amt-11-5199-2018, https://doi.org/10.5194/amt-11-5199-2018, 2018
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Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-200, https://doi.org/10.5194/amt-2018-200, 2018
Manuscript under review for AMT
Song Liu, Pieter Valks, Gaia Pinardi, Isabelle De Smedt, Huan Yu, Steffen Beirle, and Andreas Richter
Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-235, https://doi.org/10.5194/amt-2018-235, 2018
Manuscript under review for AMT
Marina Zara, K. Folkert Boersma, Isabelle De Smedt, Andreas Richter, Enno Peters, Jos H. G. M. van Geffen, Steffen Beirle, Thomas Wagner, Michel Van Roozendael, Sergey Marchenko, Lok N. Lamsal, and Henk J. Eskes
Atmos. Meas. Tech., 11, 4033-4058, https://doi.org/10.5194/amt-11-4033-2018, https://doi.org/10.5194/amt-11-4033-2018, 2018
Isabelle De Smedt, Nicolas Theys, Huan Yu, Thomas Danckaert, Christophe Lerot, Steven Compernolle, Michel Van Roozendael, Andreas Richter, Andreas Hilboll, Enno Peters, Mattia Pedergnana, Diego Loyola, Steffen Beirle, Thomas Wagner, Henk Eskes, Jos van Geffen, Klaas Folkert Boersma, and Pepijn Veefkind
Atmos. Meas. Tech., 11, 2395-2426, https://doi.org/10.5194/amt-11-2395-2018, https://doi.org/10.5194/amt-11-2395-2018, 2018
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Atmos. Chem. Phys. Discuss., https://doi.org/10.5194/acp-2017-1136, https://doi.org/10.5194/acp-2017-1136, 2018
Revised manuscript accepted for ACP
Hannah Sonderfeld, Hartmut Bösch, Antoine P. R. Jeanjean, Stuart N. Riddick, Grant Allen, Sébastien Ars, Stewart Davies, Neil Harris, Neil Humpage, Roland Leigh, and Joseph Pitt
Atmos. Meas. Tech., 10, 3931-3946, https://doi.org/10.5194/amt-10-3931-2017, https://doi.org/10.5194/amt-10-3931-2017, 2017
Yang Wang, Steffen Beirle, Johannes Lampel, Mariliza Koukouli, Isabelle De Smedt, Nicolas Theys, Ang Li, Dexia Wu, Pinhua Xie, Cheng Liu, Michel Van Roozendael, Trissevgeni Stavrakou, Jean-François Müller, and Thomas Wagner
Atmos. Chem. Phys., 17, 5007-5033, https://doi.org/10.5194/acp-17-5007-2017, https://doi.org/10.5194/acp-17-5007-2017, 2017
Michael P. Barkley, Gonzalo González Abad, Thomas P. Kurosu, Robert Spurr, Sara Torbatian, and Christophe Lerot
Atmos. Chem. Phys., 17, 4687-4709, https://doi.org/10.5194/acp-17-4687-2017, https://doi.org/10.5194/acp-17-4687-2017, 2017
Alba Lorente, K. Folkert Boersma, Huan Yu, Steffen Dörner, Andreas Hilboll, Andreas Richter, Mengyao Liu, Lok N. Lamsal, Michael Barkley, Isabelle De Smedt, Michel Van Roozendael, Yang Wang, Thomas Wagner, Steffen Beirle, Jin-Tai Lin, Nickolay Krotkov, Piet Stammes, Ping Wang, Henk J. Eskes, and Maarten Krol
Atmos. Meas. Tech., 10, 759-782, https://doi.org/10.5194/amt-10-759-2017, https://doi.org/10.5194/amt-10-759-2017, 2017
Clio Gielen, François Hendrick, Gaia Pinardi, Isabelle De Smedt, Caroline Fayt, Christian Hermans, Trissevgeni Stavrakou, Maite Bauwens, Jean-Francois Müller, Eugène Ndenzako, Pierre Nzohabonayo, Rachel Akimana, Sebastien Niyonzima, Michel Van Roozendael, and Martine De Mazière
Atmos. Chem. Phys. Discuss., https://doi.org/10.5194/acp-2016-1104, https://doi.org/10.5194/acp-2016-1104, 2017
Revised manuscript has not been submitted
Lei Zhu, Daniel J. Jacob, Patrick S. Kim, Jenny A. Fisher, Karen Yu, Katherine R. Travis, Loretta J. Mickley, Robert M. Yantosca, Melissa P. Sulprizio, Isabelle De Smedt, Gonzalo González Abad, Kelly Chance, Can Li, Richard Ferrare, Alan Fried, Johnathan W. Hair, Thomas F. Hanisco, Dirk Richter, Amy Jo Scarino, James Walega, Petter Weibring, and Glenn M. Wolfe
Atmos. Chem. Phys., 16, 13477-13490, https://doi.org/10.5194/acp-16-13477-2016, https://doi.org/10.5194/acp-16-13477-2016, 2016
Robert J. Parker, Hartmut Boesch, Martin J. Wooster, David P. Moore, Alex J. Webb, David Gaveau, and Daniel Murdiyarso
Atmos. Chem. Phys., 16, 10111-10131, https://doi.org/10.5194/acp-16-10111-2016, https://doi.org/10.5194/acp-16-10111-2016, 2016
R. J. Parker, H. Boesch, K. Byckling, A. J. Webb, P. I. Palmer, L. Feng, P. Bergamaschi, F. Chevallier, J. Notholt, N. Deutscher, T. Warneke, F. Hase, R. Sussmann, S. Kawakami, R. Kivi, D. W. T. Griffith, and V. Velazco
Atmos. Meas. Tech., 8, 4785-4801, https://doi.org/10.5194/amt-8-4785-2015, https://doi.org/10.5194/amt-8-4785-2015, 2015
I. De Smedt, T. Stavrakou, F. Hendrick, T. Danckaert, T. Vlemmix, G. Pinardi, N. Theys, C. Lerot, C. Gielen, C. Vigouroux, C. Hermans, C. Fayt, P. Veefkind, J.-F. Müller, and M. Van Roozendael
Atmos. Chem. Phys., 15, 12519-12545, https://doi.org/10.5194/acp-15-12519-2015, https://doi.org/10.5194/acp-15-12519-2015, 2015
T. Stavrakou, J.-F. Müller, M. Bauwens, I. De Smedt, M. Van Roozendael, M. De Mazière, C. Vigouroux, F. Hendrick, M. George, C. Clerbaux, P.-F. Coheur, and A. Guenther
Atmos. Chem. Phys., 15, 11861-11884, https://doi.org/10.5194/acp-15-11861-2015, https://doi.org/10.5194/acp-15-11861-2015, 2015
W. Hewson, M. P. Barkley, G. Gonzalez Abad, H. Bösch, T. Kurosu, R. Spurr, and L. G. Tilstra
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Atmos. Chem. Phys., 15, 8559-8576, https://doi.org/10.5194/acp-15-8559-2015, https://doi.org/10.5194/acp-15-8559-2015, 2015
J. H. G. M. van Geffen, K. F. Boersma, M. Van Roozendael, F. Hendrick, E. Mahieu, I. De Smedt, M. Sneep, and J. P. Veefkind
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Atmos. Meas. Tech., 8, 941-963, https://doi.org/10.5194/amt-8-941-2015, https://doi.org/10.5194/amt-8-941-2015, 2015
A. Geddes and H. Bösch
Atmos. Meas. Tech., 8, 859-874, https://doi.org/10.5194/amt-8-859-2015, https://doi.org/10.5194/amt-8-859-2015, 2015
H. Boesch, N. M. Deutscher, T. Warneke, K. Byckling, A. J. Cogan, D. W. T. Griffith, J. Notholt, R. J. Parker, and Z. Wang
Atmos. Meas. Tech., 6, 599-612, https://doi.org/10.5194/amt-6-599-2013, https://doi.org/10.5194/amt-6-599-2013, 2013
Related subject area
Subject: Gases | Technique: Remote Sensing | Topic: Validation and Intercomparisons
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Atmos. Meas. Tech., 10, 4521-4536, https://doi.org/10.5194/amt-10-4521-2017, https://doi.org/10.5194/amt-10-4521-2017, 2017
René Stübi, Herbert Schill, Jörg Klausen, Laurent Vuilleumier, Julian Gröbner, Luca Egli, and Dominique Ruffieux
Atmos. Meas. Tech., 10, 4479-4490, https://doi.org/10.5194/amt-10-4479-2017, https://doi.org/10.5194/amt-10-4479-2017, 2017
Travis N. Knepp, Richard Querel, Paul Johnston, Larry Thomason, David Flittner, and Joseph M. Zawodny
Atmos. Meas. Tech., 10, 4363-4372, https://doi.org/10.5194/amt-10-4363-2017, https://doi.org/10.5194/amt-10-4363-2017, 2017
Maria Filioglou, Anna Nikandrova, Sami Niemelä, Holger Baars, Tero Mielonen, Ari Leskinen, David Brus, Sami Romakkaniemi, Elina Giannakaki, and Mika Komppula
Atmos. Meas. Tech., 10, 4303-4316, https://doi.org/10.5194/amt-10-4303-2017, https://doi.org/10.5194/amt-10-4303-2017, 2017
Augustinus J. C. Berkhout, Daan P. J. Swart, Hester Volten, Lou F. L. Gast, Marty Haaima, Hans Verboom, Guus Stefess, Theo Hafkenscheid, and Ronald Hoogerbrugge
Atmos. Meas. Tech., 10, 4099-4120, https://doi.org/10.5194/amt-10-4099-2017, https://doi.org/10.5194/amt-10-4099-2017, 2017
Travis N. Knepp, James J. Szykman, Russell Long, Rachelle M. Duvall, Jonathan Krug, Melinda Beaver, Kevin Cavender, Keith Kronmiller, Michael Wheeler, Ruben Delgado, Raymond Hoff, Timothy Berkoff, Erik Olson, Richard Clark, Daniel Wolfe, David Van Gilst, and Doreen Neil
Atmos. Meas. Tech., 10, 3963-3983, https://doi.org/10.5194/amt-10-3963-2017, https://doi.org/10.5194/amt-10-3963-2017, 2017
Naoko Saitoh, Shuhei Kimoto, Ryo Sugimura, Ryoichi Imasu, Kei Shiomi, Akihiko Kuze, Yosuke Niwa, Toshinobu Machida, Yousuke Sawa, and Hidekazu Matsueda
Atmos. Meas. Tech., 10, 3877-3892, https://doi.org/10.5194/amt-10-3877-2017, https://doi.org/10.5194/amt-10-3877-2017, 2017
Lihua Wang, Michael J. Newchurch, Raul J. Alvarez II, Timothy A. Berkoff, Steven S. Brown, William Carrion, Russell J. De Young, Bryan J. Johnson, Rene Ganoe, Guillaume Gronoff, Guillaume Kirgis, Shi Kuang, Andrew O. Langford, Thierry Leblanc, Erin E. McDuffie, Thomas J. McGee, Denis Pliutau, Christoph J. Senff, John T. Sullivan, Grant Sumnicht, Laurence W. Twigg, and Andrew J. Weinheimer
Atmos. Meas. Tech., 10, 3865-3876, https://doi.org/10.5194/amt-10-3865-2017, https://doi.org/10.5194/amt-10-3865-2017, 2017
Yang Wang, Steffen Beirle, Francois Hendrick, Andreas Hilboll, Junli Jin, Aleksandra A. Kyuberis, Johannes Lampel, Ang Li, Yuhan Luo, Lorenzo Lodi, Jianzhong Ma, Monica Navarro, Ivan Ortega, Enno Peters, Oleg L. Polyansky, Julia Remmers, Andreas Richter, Olga Puentedura, Michel Van Roozendael, André Seyler, Jonathan Tennyson, Rainer Volkamer, Pinhua Xie, Nikolai F. Zobov, and Thomas Wagner
Atmos. Meas. Tech., 10, 3719-3742, https://doi.org/10.5194/amt-10-3719-2017, https://doi.org/10.5194/amt-10-3719-2017, 2017
Kevin S. Olsen, Kimberly Strong, Kaley A. Walker, Chris D. Boone, Piera Raspollini, Johannes Plieninger, Whitney Bader, Stephanie Conway, Michel Grutter, James W. Hannigan, Frank Hase, Nicholas Jones, Martine de Mazière, Justus Notholt, Matthias Schneider, Dan Smale, Ralf Sussmann, and Naoko Saitoh
Atmos. Meas. Tech., 10, 3697-3718, https://doi.org/10.5194/amt-10-3697-2017, https://doi.org/10.5194/amt-10-3697-2017, 2017
Jiyoung Kim, Jhoon Kim, Hi-Ku Cho, Jay Herman, Sang Seo Park, Hyun Kwang Lim, Jae-Hwan Kim, Koji Miyagawa, and Yun Gon Lee
Atmos. Meas. Tech., 10, 3661-3676, https://doi.org/10.5194/amt-10-3661-2017, https://doi.org/10.5194/amt-10-3661-2017, 2017
Jay Herman, Robert Evans, Alexander Cede, Nader Abuhassan, Irina Petropavlovskikh, Glenn McConville, Koji Miyagawa, and Brandon Noirot
Atmos. Meas. Tech., 10, 3539-3545, https://doi.org/10.5194/amt-10-3539-2017, https://doi.org/10.5194/amt-10-3539-2017, 2017
Sven Krautwurst, Konstantin Gerilowski, Haflidi H. Jonsson, David R. Thompson, Richard W. Kolyer, Laura T. Iraci, Andrew K. Thorpe, Markus Horstjann, Michael Eastwood, Ira Leifer, Samuel A. Vigil, Thomas Krings, Jakob Borchardt, Michael Buchwitz, Matthew M. Fladeland, John P. Burrows, and Heinrich Bovensmann
Atmos. Meas. Tech., 10, 3429-3452, https://doi.org/10.5194/amt-10-3429-2017, https://doi.org/10.5194/amt-10-3429-2017, 2017
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Atmos. Meas. Tech., 10, 3359-3373, https://doi.org/10.5194/amt-10-3359-2017, https://doi.org/10.5194/amt-10-3359-2017, 2017
Eleanor M. Waxman, Kevin C. Cossel, Gar-Wing Truong, Fabrizio R. Giorgetta, William C. Swann, Sean Coburn, Robert J. Wright, Gregory B. Rieker, Ian Coddington, and Nathan R. Newbury
Atmos. Meas. Tech., 10, 3295-3311, https://doi.org/10.5194/amt-10-3295-2017, https://doi.org/10.5194/amt-10-3295-2017, 2017
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Dan Weaver, Kimberly Strong, Matthias Schneider, Penny M. Rowe, Chris Sioris, Kaley A. Walker, Zen Mariani, Taneil Uttal, C. Thomas McElroy, Holger Vömel, Alessio Spassiani, and James R. Drummond
Atmos. Meas. Tech., 10, 2851-2880, https://doi.org/10.5194/amt-10-2851-2017, https://doi.org/10.5194/amt-10-2851-2017, 2017
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Atmos. Meas. Tech., 10, 2759-2771, https://doi.org/10.5194/amt-10-2759-2017, https://doi.org/10.5194/amt-10-2759-2017, 2017
Eddy F. Plaza-Medina, Wolfgang Stremme, Alejandro Bezanilla, Michel Grutter, Matthias Schneider, Frank Hase, and Thomas Blumenstock
Atmos. Meas. Tech., 10, 2703-2725, https://doi.org/10.5194/amt-10-2703-2017, https://doi.org/10.5194/amt-10-2703-2017, 2017
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Cited articles
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