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IF 3.248
CiteScore 3.37
SNIP 1.253
SJR 1.869
h5-index 47
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Volume 9, issue 1 |
Copyright
Atmos. Meas. Tech., 9, 227-248, 2016
https://doi.org/10.5194/amt-9-227-2016
© Author(s) 2016. This work is distributed under
the Creative Commons Attribution 3.0 License.
https://doi.org/10.5194/amt-9-227-2016
© Author(s) 2016. This work is distributed under
the Creative Commons Attribution 3.0 License.
Atmos. Meas. Tech., 9, 227-248, 2016
https://doi.org/10.5194/amt-9-227-2016
© Author(s) 2016. This work is distributed under
the Creative Commons Attribution 3.0 License.
https://doi.org/10.5194/amt-9-227-2016
© Author(s) 2016. This work is distributed under
the Creative Commons Attribution 3.0 License.
Research article 26 Jan 2016
Research article | 26 Jan 2016
Carbon monoxide total columns from SCIAMACHY 2.3 µm atmospheric reflectance measurements: towards a full-mission data product (2003–2012)
T. Borsdorff et al.Related authors
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Atmos. Meas. Tech., 11, 3111-3130, https://doi.org/10.5194/amt-11-3111-2018, https://doi.org/10.5194/amt-11-3111-2018, 2018
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Atmos. Meas. Tech., 10, 1769-1782, https://doi.org/10.5194/amt-10-1769-2017, https://doi.org/10.5194/amt-10-1769-2017, 2017
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Atmos. Meas. Tech., 8, 1799-1818, https://doi.org/10.5194/amt-8-1799-2015, https://doi.org/10.5194/amt-8-1799-2015, 2015
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L. Guanter, I. Aben, P. Tol, J. M. Krijger, A. Hollstein, P. Köhler, A. Damm, J. Joiner, C. Frankenberg, and J. Landgraf
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S. J. Sutanto, G. Hoffmann, R. A. Scheepmaker, J. Worden, S. Houweling, K. Yoshimura, I. Aben, and T. Röckmann
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S. Massart, A. Agusti-Panareda, I. Aben, A. Butz, F. Chevallier, C. Crevoisier, R. Engelen, C. Frankenberg, and O. Hasekamp
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A. Galli, S. Guerlet, A. Butz, I. Aben, H. Suto, A. Kuze, N. M. Deutscher, J. Notholt, D. Wunch, P. O. Wennberg, D. W. T. Griffith, O. Hasekamp, and J. Landgraf
Atmos. Meas. Tech., 7, 1105-1119, https://doi.org/10.5194/amt-7-1105-2014, https://doi.org/10.5194/amt-7-1105-2014, 2014
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Atmos. Chem. Phys., 14, 3991-4012, https://doi.org/10.5194/acp-14-3991-2014, https://doi.org/10.5194/acp-14-3991-2014, 2014
T. Borsdorff, O. P. Hasekamp, A. Wassmann, and J. Landgraf
Atmos. Meas. Tech., 7, 523-535, https://doi.org/10.5194/amt-7-523-2014, https://doi.org/10.5194/amt-7-523-2014, 2014
A. du Piesanie, A. J. M. Piters, I. Aben, H. Schrijver, P. Wang, and S. Noël
Atmos. Meas. Tech., 6, 2925-2940, https://doi.org/10.5194/amt-6-2925-2013, https://doi.org/10.5194/amt-6-2925-2013, 2013
R. A. Scheepmaker, C. Frankenberg, A. Galli, A. Butz, H. Schrijver, N. M. Deutscher, D. Wunch, T. Warneke, S. Fally, and I. Aben
Atmos. Meas. Tech., 6, 879-894, https://doi.org/10.5194/amt-6-879-2013, https://doi.org/10.5194/amt-6-879-2013, 2013
H. M. Worden, M. N. Deeter, C. Frankenberg, M. George, F. Nichitiu, J. Worden, I. Aben, K. W. Bowman, C. Clerbaux, P. F. Coheur, A. T. J. de Laat, R. Detweiler, J. R. Drummond, D. P. Edwards, J. C. Gille, D. Hurtmans, M. Luo, S. Martínez-Alonso, S. Massie, G. Pfister, and J. X. Warner
Atmos. Chem. Phys., 13, 837-850, https://doi.org/10.5194/acp-13-837-2013, https://doi.org/10.5194/acp-13-837-2013, 2013
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Atmos. Meas. Tech., 11, 4707-4723, https://doi.org/10.5194/amt-11-4707-2018, https://doi.org/10.5194/amt-11-4707-2018, 2018
Jay Herman, Elena Spinei, Alan Fried, Jhoon Kim, Jae Kim, Woogyung Kim, Alexander Cede, Nader Abuhassan, and Michal Segal-Rozenhaimer
Atmos. Meas. Tech., 11, 4583-4603, https://doi.org/10.5194/amt-11-4583-2018, https://doi.org/10.5194/amt-11-4583-2018, 2018
Paul J. J. Tol, Tim A. van Kempen, Richard M. van Hees, Matthijs Krijger, Sidney Cadot, Ralph Snel, Stefan T. Persijn, Ilse Aben, and Ruud W. M. Hoogeveen
Atmos. Meas. Tech., 11, 4493-4507, https://doi.org/10.5194/amt-11-4493-2018, https://doi.org/10.5194/amt-11-4493-2018, 2018
Alba Lorente, K. Folkert Boersma, Piet Stammes, L. Gijsbert Tilstra, Andreas Richter, Huan Yu, Said Kharbouche, and Jan-Peter Muller
Atmos. Meas. Tech., 11, 4509-4529, https://doi.org/10.5194/amt-11-4509-2018, https://doi.org/10.5194/amt-11-4509-2018, 2018
Omaira E. García, Matthias Schneider, Benjamin Ertl, Eliezer Sepúlveda, Christian Borger, Christopher Diekmann, Andreas Wiegele, Frank Hase, Sabine Barthlott, Thomas Blumenstock, Uwe Raffalski, Angel Gómez-Peláez, Martin Steinbacher, Ludwig Ries, and Angel M. de Frutos
Atmos. Meas. Tech., 11, 4171-4215, https://doi.org/10.5194/amt-11-4171-2018, https://doi.org/10.5194/amt-11-4171-2018, 2018
Anna Solvejg Dinger, Kerstin Stebel, Massimo Cassiani, Hamidreza Ardeshiri, Cirilo Bernardo, Arve Kylling, Soon-Young Park, Ignacio Pisso, Norbert Schmidbauer, Jan Wasseng, and Andreas Stohl
Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-208, https://doi.org/10.5194/amt-2018-208, 2018
Revised manuscript accepted for AMT
Matthew S. Johnson, Xiong Liu, Peter Zoogman, John Sullivan, Michael J. Newchurch, Shi Kuang, Thierry Leblanc, and Thomas McGee
Atmos. Meas. Tech., 11, 3457-3477, https://doi.org/10.5194/amt-11-3457-2018, https://doi.org/10.5194/amt-11-3457-2018, 2018
Nan Ding, Shubi Zhang, Suqin Wu, Xiaoming Wang, Allison Kealy, and Kefei Zhang
Atmos. Meas. Tech., 11, 3511-3522, https://doi.org/10.5194/amt-11-3511-2018, https://doi.org/10.5194/amt-11-3511-2018, 2018
Jeffrey A. Geddes, Randall V. Martin, Eric J. Bucsela, Chris A. McLinden, and Daniel J. M. Cunningham
Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-148, https://doi.org/10.5194/amt-2018-148, 2018
Revised manuscript accepted for AMT
Andreas Schneider, Tobias Borsdorff, Joost aan de Brugh, Haili Hu, and Jochen Landgraf
Atmos. Meas. Tech., 11, 3339-3350, https://doi.org/10.5194/amt-11-3339-2018, https://doi.org/10.5194/amt-11-3339-2018, 2018
Lianghai Wu, Otto Hasekamp, Haili Hu, Jochen Landgraf, Andre Butz, Joost aan de Brugh, Ilse Aben, Dave F. Pollard, David W. T. Griffith, Dietrich G. Feist, Dmitry Koshelev, Frank Hase, Geoffrey C. Toon, Hirofumi Ohyama, Isamu Morino, Justus Notholt, Kei Shiomi, Laura Iraci, Matthias Schneider, Martine de Mazière, Ralf Sussmann, Rigel Kivi, Thorsten Warneke, Tae-Young Goo, and Yao Té
Atmos. Meas. Tech., 11, 3111-3130, https://doi.org/10.5194/amt-11-3111-2018, https://doi.org/10.5194/amt-11-3111-2018, 2018
Jian-Xiong Sheng, Daniel J. Jacob, Joannes D. Maasakkers, Yuzhong Zhang, and Melissa P. Sulprizio
Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-121, https://doi.org/10.5194/amt-2018-121, 2018
Revised manuscript accepted for AMT
Matthew J. Cooper, Randall V. Martin, Alexei I. Lyapustin, and Chris A. McLinden
Atmos. Meas. Tech., 11, 2983-2994, https://doi.org/10.5194/amt-11-2983-2018, https://doi.org/10.5194/amt-11-2983-2018, 2018
Youwen Sun, Mathias Palm, Cheng Liu, Frank Hase, David Griffith, Christine Weinzierl, Christof Petri, Wei Wang, and Justus Notholt
Atmos. Meas. Tech., 11, 2879-2896, https://doi.org/10.5194/amt-11-2879-2018, https://doi.org/10.5194/amt-11-2879-2018, 2018
Guangyao Dai, Dietrich Althausen, Julian Hofer, Ronny Engelmann, Patric Seifert, Johannes Bühl, Rodanthi-Elisavet Mamouri, Songhua Wu, and Albert Ansmann
Atmos. Meas. Tech., 11, 2735-2748, https://doi.org/10.5194/amt-11-2735-2018, https://doi.org/10.5194/amt-11-2735-2018, 2018
Tobias Borsdorff, Josip Andrasec, Joost aan de Brugh, Haili Hu, Ilse Aben, and Jochen Landgraf
Atmos. Meas. Tech., 11, 2553-2565, https://doi.org/10.5194/amt-11-2553-2018, https://doi.org/10.5194/amt-11-2553-2018, 2018
Daniel J. Zawada, Landon A. Rieger, Adam E. Bourassa, and Douglas A. Degenstein
Atmos. Meas. Tech., 11, 2375-2393, https://doi.org/10.5194/amt-11-2375-2018, https://doi.org/10.5194/amt-11-2375-2018, 2018
Isabelle De Smedt, Nicolas Theys, Huan Yu, Thomas Danckaert, Christophe Lerot, Steven Compernolle, Michel Van Roozendael, Andreas Richter, Andreas Hilboll, Enno Peters, Mattia Pedergnana, Diego Loyola, Steffen Beirle, Thomas Wagner, Henk Eskes, Jos van Geffen, Klaas Folkert Boersma, and Pepijn Veefkind
Atmos. Meas. Tech., 11, 2395-2426, https://doi.org/10.5194/amt-11-2395-2018, https://doi.org/10.5194/amt-11-2395-2018, 2018
Sweta Shah, Olaf N. E. Tuinder, Jacob C. A. van Peet, Adrianus T. J. de Laat, and Piet Stammes
Atmos. Meas. Tech., 11, 2345-2360, https://doi.org/10.5194/amt-11-2345-2018, https://doi.org/10.5194/amt-11-2345-2018, 2018
Manuel López-Puertas, Maya García-Comas, Bernd Funke, Angela Gardini, Gabriele P. Stiller, Thomas von Clarmann, Norbert Glatthor, Alexandra Laeng, Martin Kaufmann, Viktoria F. Sofieva, Lucien Froidevaux, Kaley A. Walker, and Masato Shiotani
Atmos. Meas. Tech., 11, 2187-2212, https://doi.org/10.5194/amt-11-2187-2018, https://doi.org/10.5194/amt-11-2187-2018, 2018
Carlo Arosio, Alexei Rozanov, Elizaveta Malinina, Kai-Uwe Eichmann, Thomas von Clarmann, and John P. Burrows
Atmos. Meas. Tech., 11, 2135-2149, https://doi.org/10.5194/amt-11-2135-2018, https://doi.org/10.5194/amt-11-2135-2018, 2018
Raul Cristian Scarlat, Christian Melsheimer, and Georg Heygster
Atmos. Meas. Tech., 11, 2067-2084, https://doi.org/10.5194/amt-11-2067-2018, https://doi.org/10.5194/amt-11-2067-2018, 2018
Joseph Mendonca, Kimberly Strong, Debra Wunch, Geoffrey C. Toon, David A. Long, Joseph T. Hodges, Vincent T. Sironneau, and Jonathan E. Franklin
Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-62, https://doi.org/10.5194/amt-2018-62, 2018
Revised manuscript accepted for AMT
Maria Elissavet Koukouli, Nicolas Theys, Jieying Ding, Irene Zyrichidou, Bas Mijling, Dimitrios Balis, and Ronald Johannes van der A
Atmos. Meas. Tech., 11, 1817-1832, https://doi.org/10.5194/amt-11-1817-2018, https://doi.org/10.5194/amt-11-1817-2018, 2018
Tomohiro O. Sato, Takao M. Sato, Hideo Sagawa, Katsuyuki Noguchi, Naoko Saitoh, Hitoshi Irie, Kazuyuki Kita, Mona E. Mahani, Koji Zettsu, Ryoichi Imasu, Sachiko Hayashida, and Yasuko Kasai
Atmos. Meas. Tech., 11, 1653-1668, https://doi.org/10.5194/amt-11-1653-2018, https://doi.org/10.5194/amt-11-1653-2018, 2018
Edward Malina, Yukio Yoshida, Tsuneo Matsunaga, and Jan-Peter Muller
Atmos. Meas. Tech., 11, 1159-1179, https://doi.org/10.5194/amt-11-1159-2018, https://doi.org/10.5194/amt-11-1159-2018, 2018
Panagiotis-Ioannis Raptis, Stelios Kazadzis, Julian Gröbner, Natalia Kouremeti, Lionel Doppler, Ralf Becker, and Constantinos Helmis
Atmos. Meas. Tech., 11, 1143-1157, https://doi.org/10.5194/amt-11-1143-2018, https://doi.org/10.5194/amt-11-1143-2018, 2018
Simone Ceccherini, Bruno Carli, Cecilia Tirelli, Nicola Zoppetti, Samuele Del Bianco, Ugo Cortesi, Jukka Kujanpää, and Rossana Dragani
Atmos. Meas. Tech., 11, 1009-1017, https://doi.org/10.5194/amt-11-1009-2018, https://doi.org/10.5194/amt-11-1009-2018, 2018
Fredrick W. Irion, Brian H. Kahn, Mathias M. Schreier, Eric J. Fetzer, Evan Fishbein, Dejian Fu, Peter Kalmus, R. Chris Wilson, Sun Wong, and Qing Yue
Atmos. Meas. Tech., 11, 971-995, https://doi.org/10.5194/amt-11-971-2018, https://doi.org/10.5194/amt-11-971-2018, 2018
Klaus Gierens, Kostas Eleftheratos, and Robert Sausen
Atmos. Meas. Tech., 11, 939-948, https://doi.org/10.5194/amt-11-939-2018, https://doi.org/10.5194/amt-11-939-2018, 2018
Jonas Gliß, Kerstin Stebel, Arve Kylling, and Aasmund Sudbø
Atmos. Meas. Tech., 11, 781-801, https://doi.org/10.5194/amt-11-781-2018, https://doi.org/10.5194/amt-11-781-2018, 2018
Grégoire Broquet, François-Marie Bréon, Emmanuel Renault, Michael Buchwitz, Maximilian Reuter, Heinrich Bovensmann, Frédéric Chevallier, Lin Wu, and Philippe Ciais
Atmos. Meas. Tech., 11, 681-708, https://doi.org/10.5194/amt-11-681-2018, https://doi.org/10.5194/amt-11-681-2018, 2018
Minqiang Zhou, Bavo Langerock, Corinne Vigouroux, Pucai Wang, Christian Hermans, Gabriele Stiller, Kaley A. Walker, Geoff Dutton, Emmanuel Mahieu, and Martine De Mazière
Atmos. Meas. Tech., 11, 651-662, https://doi.org/10.5194/amt-11-651-2018, https://doi.org/10.5194/amt-11-651-2018, 2018
Adam E. Bourassa, Chris Z. Roth, Daniel J. Zawada, Landon A. Rieger, Chris A. McLinden, and Douglas A. Degenstein
Atmos. Meas. Tech., 11, 489-498, https://doi.org/10.5194/amt-11-489-2018, https://doi.org/10.5194/amt-11-489-2018, 2018
Jianping Mao, Anand Ramanathan, James B. Abshire, Stephan R. Kawa, Haris Riris, Graham R. Allan, Michael Rodriguez, William E. Hasselbrack, Xiaoli Sun, Kenji Numata, Jeff Chen, Yonghoon Choi, and Mei Ying Melissa Yang
Atmos. Meas. Tech., 11, 127-140, https://doi.org/10.5194/amt-11-127-2018, https://doi.org/10.5194/amt-11-127-2018, 2018
Germar Bernhard, Irina Petropavlovskikh, and Bernhard Mayer
Atmos. Meas. Tech., 10, 4979-4994, https://doi.org/10.5194/amt-10-4979-2017, https://doi.org/10.5194/amt-10-4979-2017, 2017
Martin Van Damme, Simon Whitburn, Lieven Clarisse, Cathy Clerbaux, Daniel Hurtmans, and Pierre-François Coheur
Atmos. Meas. Tech., 10, 4905-4914, https://doi.org/10.5194/amt-10-4905-2017, https://doi.org/10.5194/amt-10-4905-2017, 2017
Johannes Lampel, Yang Wang, Andreas Hilboll, Steffen Beirle, Holger Sihler, Janis Puķīte, Ulrich Platt, and Thomas Wagner
Atmos. Meas. Tech., 10, 4819-4831, https://doi.org/10.5194/amt-10-4819-2017, https://doi.org/10.5194/amt-10-4819-2017, 2017
Andrew R. D. Smedley, John S. Rimmer, and Ann R. Webb
Atmos. Meas. Tech., 10, 4697-4704, https://doi.org/10.5194/amt-10-4697-2017, https://doi.org/10.5194/amt-10-4697-2017, 2017
Evelyn De Wachter, Nicolas Kumps, Ann Carine Vandaele, Bavo Langerock, and Martine De Mazière
Atmos. Meas. Tech., 10, 4623-4638, https://doi.org/10.5194/amt-10-4623-2017, https://doi.org/10.5194/amt-10-4623-2017, 2017
Joshua L. Laughner and Ronald C. Cohen
Atmos. Meas. Tech., 10, 4403-4419, https://doi.org/10.5194/amt-10-4403-2017, https://doi.org/10.5194/amt-10-4403-2017, 2017
Juseon Bak, Xiong Liu, Jae-Hwan Kim, David P. Haffner, Kelly Chance, Kai Yang, and Kang Sun
Atmos. Meas. Tech., 10, 4373-4388, https://doi.org/10.5194/amt-10-4373-2017, https://doi.org/10.5194/amt-10-4373-2017, 2017
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