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Volume 9, issue 1 |
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Atmos. Meas. Tech., 9, 227-248, 2016
https://doi.org/10.5194/amt-9-227-2016
© Author(s) 2016. This work is distributed under
the Creative Commons Attribution 3.0 License.
https://doi.org/10.5194/amt-9-227-2016
© Author(s) 2016. This work is distributed under
the Creative Commons Attribution 3.0 License.
Atmos. Meas. Tech., 9, 227-248, 2016
https://doi.org/10.5194/amt-9-227-2016
© Author(s) 2016. This work is distributed under
the Creative Commons Attribution 3.0 License.
https://doi.org/10.5194/amt-9-227-2016
© Author(s) 2016. This work is distributed under
the Creative Commons Attribution 3.0 License.
Research article 26 Jan 2016
Research article | 26 Jan 2016
Carbon monoxide total columns from SCIAMACHY 2.3 µm atmospheric reflectance measurements: towards a full-mission data product (2003–2012)
T. Borsdorff et al.Related authors
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H. M. Worden, M. N. Deeter, C. Frankenberg, M. George, F. Nichitiu, J. Worden, I. Aben, K. W. Bowman, C. Clerbaux, P. F. Coheur, A. T. J. de Laat, R. Detweiler, J. R. Drummond, D. P. Edwards, J. C. Gille, D. Hurtmans, M. Luo, S. Martínez-Alonso, S. Massie, G. Pfister, and J. X. Warner
Atmos. Chem. Phys., 13, 837-850, https://doi.org/10.5194/acp-13-837-2013, https://doi.org/10.5194/acp-13-837-2013, 2013
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Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-171, https://doi.org/10.5194/amt-2018-171, 2018
Revised manuscript accepted for AMT
Lianghai Wu, Otto Hasekamp, Haili Hu, Jochen Landgraf, Andre Butz, Joost aan de Brugh, Ilse Aben, Dave F. Pollard, David W. T. Griffith, Dietrich G. Feist, Dmitry Koshelev, Frank Hase, Geoffrey C. Toon, Hirofumi Ohyama, Isamu Morino, Justus Notholt, Kei Shiomi, Laura Iraci, Matthias Schneider, Martine de Mazière, Ralf Sussmann, Rigel Kivi, Thorsten Warneke, Tae-Young Goo, and Yao Té
Atmos. Meas. Tech., 11, 3111-3130, https://doi.org/10.5194/amt-11-3111-2018, https://doi.org/10.5194/amt-11-3111-2018, 2018
Matthew J. Cooper, Randall V. Martin, Alexei I. Lyapustin, and Chris A. McLinden
Atmos. Meas. Tech., 11, 2983-2994, https://doi.org/10.5194/amt-11-2983-2018, https://doi.org/10.5194/amt-11-2983-2018, 2018
Youwen Sun, Mathias Palm, Cheng Liu, Frank Hase, David Griffith, Christine Weinzierl, Christof Petri, Wei Wang, and Justus Notholt
Atmos. Meas. Tech., 11, 2879-2896, https://doi.org/10.5194/amt-11-2879-2018, https://doi.org/10.5194/amt-11-2879-2018, 2018
Dejian Fu, Susan S. Kulawik, Kazuyuki Miyazaki, Kevin W. Bowman, John R. Worden, Annmarie Eldering, Nathaniel J. Livesey, Joao Teixeira, Fredrick W. Irion, Robert L. Herman, Gregory B. Osterman, Xiong Liu, Pieternel F. Levelt, Anne M. Thompson, and Ming Luo
Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-138, https://doi.org/10.5194/amt-2018-138, 2018
Revised manuscript accepted for AMT
Guangyao Dai, Dietrich Althausen, Julian Hofer, Ronny Engelmann, Patric Seifert, Johannes Bühl, Rodanthi-Elisavet Mamouri, Songhua Wu, and Albert Ansmann
Atmos. Meas. Tech., 11, 2735-2748, https://doi.org/10.5194/amt-11-2735-2018, https://doi.org/10.5194/amt-11-2735-2018, 2018
Tobias Borsdorff, Josip Andrasec, Joost aan de Brugh, Haili Hu, Ilse Aben, and Jochen Landgraf
Atmos. Meas. Tech., 11, 2553-2565, https://doi.org/10.5194/amt-11-2553-2018, https://doi.org/10.5194/amt-11-2553-2018, 2018
Daniel J. Zawada, Landon A. Rieger, Adam E. Bourassa, and Douglas A. Degenstein
Atmos. Meas. Tech., 11, 2375-2393, https://doi.org/10.5194/amt-11-2375-2018, https://doi.org/10.5194/amt-11-2375-2018, 2018
Isabelle De Smedt, Nicolas Theys, Huan Yu, Thomas Danckaert, Christophe Lerot, Steven Compernolle, Michel Van Roozendael, Andreas Richter, Andreas Hilboll, Enno Peters, Mattia Pedergnana, Diego Loyola, Steffen Beirle, Thomas Wagner, Henk Eskes, Jos van Geffen, Klaas Folkert Boersma, and Pepijn Veefkind
Atmos. Meas. Tech., 11, 2395-2426, https://doi.org/10.5194/amt-11-2395-2018, https://doi.org/10.5194/amt-11-2395-2018, 2018
Sweta Shah, Olaf N. E. Tuinder, Jacob C. A. van Peet, Adrianus T. J. de Laat, and Piet Stammes
Atmos. Meas. Tech., 11, 2345-2360, https://doi.org/10.5194/amt-11-2345-2018, https://doi.org/10.5194/amt-11-2345-2018, 2018
Manuel López-Puertas, Maya García-Comas, Bernd Funke, Angela Gardini, Gabriele P. Stiller, Thomas von Clarmann, Norbert Glatthor, Alexandra Laeng, Martin Kaufmann, Viktoria F. Sofieva, Lucien Froidevaux, Kaley A. Walker, and Masato Shiotani
Atmos. Meas. Tech., 11, 2187-2212, https://doi.org/10.5194/amt-11-2187-2018, https://doi.org/10.5194/amt-11-2187-2018, 2018
Carlo Arosio, Alexei Rozanov, Elizaveta Malinina, Kai-Uwe Eichmann, Thomas von Clarmann, and John P. Burrows
Atmos. Meas. Tech., 11, 2135-2149, https://doi.org/10.5194/amt-11-2135-2018, https://doi.org/10.5194/amt-11-2135-2018, 2018
Raul Cristian Scarlat, Christian Melsheimer, and Georg Heygster
Atmos. Meas. Tech., 11, 2067-2084, https://doi.org/10.5194/amt-11-2067-2018, https://doi.org/10.5194/amt-11-2067-2018, 2018
Joseph Mendonca, Kimberly Strong, Debra Wunch, Geoffrey C. Toon, David A. Long, Joseph T. Hodges, Vincent T. Sironneau, and Jonathan E. Franklin
Atmos. Meas. Tech. Discuss., https://doi.org/10.5194/amt-2018-62, https://doi.org/10.5194/amt-2018-62, 2018
Revised manuscript accepted for AMT
Maria Elissavet Koukouli, Nicolas Theys, Jieying Ding, Irene Zyrichidou, Bas Mijling, Dimitrios Balis, and Ronald Johannes van der A
Atmos. Meas. Tech., 11, 1817-1832, https://doi.org/10.5194/amt-11-1817-2018, https://doi.org/10.5194/amt-11-1817-2018, 2018
Tomohiro O. Sato, Takao M. Sato, Hideo Sagawa, Katsuyuki Noguchi, Naoko Saitoh, Hitoshi Irie, Kazuyuki Kita, Mona E. Mahani, Koji Zettsu, Ryoichi Imasu, Sachiko Hayashida, and Yasuko Kasai
Atmos. Meas. Tech., 11, 1653-1668, https://doi.org/10.5194/amt-11-1653-2018, https://doi.org/10.5194/amt-11-1653-2018, 2018
Edward Malina, Yukio Yoshida, Tsuneo Matsunaga, and Jan-Peter Muller
Atmos. Meas. Tech., 11, 1159-1179, https://doi.org/10.5194/amt-11-1159-2018, https://doi.org/10.5194/amt-11-1159-2018, 2018
Panagiotis-Ioannis Raptis, Stelios Kazadzis, Julian Gröbner, Natalia Kouremeti, Lionel Doppler, Ralf Becker, and Constantinos Helmis
Atmos. Meas. Tech., 11, 1143-1157, https://doi.org/10.5194/amt-11-1143-2018, https://doi.org/10.5194/amt-11-1143-2018, 2018
Simone Ceccherini, Bruno Carli, Cecilia Tirelli, Nicola Zoppetti, Samuele Del Bianco, Ugo Cortesi, Jukka Kujanpää, and Rossana Dragani
Atmos. Meas. Tech., 11, 1009-1017, https://doi.org/10.5194/amt-11-1009-2018, https://doi.org/10.5194/amt-11-1009-2018, 2018
Fredrick W. Irion, Brian H. Kahn, Mathias M. Schreier, Eric J. Fetzer, Evan Fishbein, Dejian Fu, Peter Kalmus, R. Chris Wilson, Sun Wong, and Qing Yue
Atmos. Meas. Tech., 11, 971-995, https://doi.org/10.5194/amt-11-971-2018, https://doi.org/10.5194/amt-11-971-2018, 2018
Klaus Gierens, Kostas Eleftheratos, and Robert Sausen
Atmos. Meas. Tech., 11, 939-948, https://doi.org/10.5194/amt-11-939-2018, https://doi.org/10.5194/amt-11-939-2018, 2018
Jonas Gliß, Kerstin Stebel, Arve Kylling, and Aasmund Sudbø
Atmos. Meas. Tech., 11, 781-801, https://doi.org/10.5194/amt-11-781-2018, https://doi.org/10.5194/amt-11-781-2018, 2018
Grégoire Broquet, François-Marie Bréon, Emmanuel Renault, Michael Buchwitz, Maximilian Reuter, Heinrich Bovensmann, Frédéric Chevallier, Lin Wu, and Philippe Ciais
Atmos. Meas. Tech., 11, 681-708, https://doi.org/10.5194/amt-11-681-2018, https://doi.org/10.5194/amt-11-681-2018, 2018
Minqiang Zhou, Bavo Langerock, Corinne Vigouroux, Pucai Wang, Christian Hermans, Gabriele Stiller, Kaley A. Walker, Geoff Dutton, Emmanuel Mahieu, and Martine De Mazière
Atmos. Meas. Tech., 11, 651-662, https://doi.org/10.5194/amt-11-651-2018, https://doi.org/10.5194/amt-11-651-2018, 2018
Adam E. Bourassa, Chris Z. Roth, Daniel J. Zawada, Landon A. Rieger, Chris A. McLinden, and Douglas A. Degenstein
Atmos. Meas. Tech., 11, 489-498, https://doi.org/10.5194/amt-11-489-2018, https://doi.org/10.5194/amt-11-489-2018, 2018
Jianping Mao, Anand Ramanathan, James B. Abshire, Stephan R. Kawa, Haris Riris, Graham R. Allan, Michael Rodriguez, William E. Hasselbrack, Xiaoli Sun, Kenji Numata, Jeff Chen, Yonghoon Choi, and Mei Ying Melissa Yang
Atmos. Meas. Tech., 11, 127-140, https://doi.org/10.5194/amt-11-127-2018, https://doi.org/10.5194/amt-11-127-2018, 2018
Germar Bernhard, Irina Petropavlovskikh, and Bernhard Mayer
Atmos. Meas. Tech., 10, 4979-4994, https://doi.org/10.5194/amt-10-4979-2017, https://doi.org/10.5194/amt-10-4979-2017, 2017
Martin Van Damme, Simon Whitburn, Lieven Clarisse, Cathy Clerbaux, Daniel Hurtmans, and Pierre-François Coheur
Atmos. Meas. Tech., 10, 4905-4914, https://doi.org/10.5194/amt-10-4905-2017, https://doi.org/10.5194/amt-10-4905-2017, 2017
Johannes Lampel, Yang Wang, Andreas Hilboll, Steffen Beirle, Holger Sihler, Janis Puķīte, Ulrich Platt, and Thomas Wagner
Atmos. Meas. Tech., 10, 4819-4831, https://doi.org/10.5194/amt-10-4819-2017, https://doi.org/10.5194/amt-10-4819-2017, 2017
Andrew R. D. Smedley, John S. Rimmer, and Ann R. Webb
Atmos. Meas. Tech., 10, 4697-4704, https://doi.org/10.5194/amt-10-4697-2017, https://doi.org/10.5194/amt-10-4697-2017, 2017
Evelyn De Wachter, Nicolas Kumps, Ann Carine Vandaele, Bavo Langerock, and Martine De Mazière
Atmos. Meas. Tech., 10, 4623-4638, https://doi.org/10.5194/amt-10-4623-2017, https://doi.org/10.5194/amt-10-4623-2017, 2017
Joshua L. Laughner and Ronald C. Cohen
Atmos. Meas. Tech., 10, 4403-4419, https://doi.org/10.5194/amt-10-4403-2017, https://doi.org/10.5194/amt-10-4403-2017, 2017
Juseon Bak, Xiong Liu, Jae-Hwan Kim, David P. Haffner, Kelly Chance, Kai Yang, and Kang Sun
Atmos. Meas. Tech., 10, 4373-4388, https://doi.org/10.5194/amt-10-4373-2017, https://doi.org/10.5194/amt-10-4373-2017, 2017
Tilman Hüneke, Oliver-Alex Aderhold, Jannik Bounin, Marcel Dorf, Eric Gentry, Katja Grossmann, Jens-Uwe Grooß, Peter Hoor, Patrick Jöckel, Mareike Kenntner, Marvin Knapp, Matthias Knecht, Dominique Lörks, Sabrina Ludmann, Sigrun Matthes, Rasmus Raecke, Marcel Reichert, Jannis Weimar, Bodo Werner, Andreas Zahn, Helmut Ziereis, and Klaus Pfeilsticker
Atmos. Meas. Tech., 10, 4209-4234, https://doi.org/10.5194/amt-10-4209-2017, https://doi.org/10.5194/amt-10-4209-2017, 2017
Astrid Ziemann, Manuela Starke, and Claudia Schütze
Atmos. Meas. Tech., 10, 4165-4190, https://doi.org/10.5194/amt-10-4165-2017, https://doi.org/10.5194/amt-10-4165-2017, 2017
Richard Siddans, Diane Knappett, Brian Kerridge, Alison Waterfall, Jane Hurley, Barry Latter, Hartmut Boesch, and Robert Parker
Atmos. Meas. Tech., 10, 4135-4164, https://doi.org/10.5194/amt-10-4135-2017, https://doi.org/10.5194/amt-10-4135-2017, 2017
Jerald R. Ziemke, Sarah A. Strode, Anne R. Douglass, Joanna Joiner, Alexander Vasilkov, Luke D. Oman, Junhua Liu, Susan E. Strahan, Pawan K. Bhartia, and David P. Haffner
Atmos. Meas. Tech., 10, 4067-4078, https://doi.org/10.5194/amt-10-4067-2017, https://doi.org/10.5194/amt-10-4067-2017, 2017
Andrew K. Thorpe, Christian Frankenberg, David R. Thompson, Riley M. Duren, Andrew D. Aubrey, Brian D. Bue, Robert O. Green, Konstantin Gerilowski, Thomas Krings, Jakob Borchardt, Eric A. Kort, Colm Sweeney, Stephen Conley, Dar A. Roberts, and Philip E. Dennison
Atmos. Meas. Tech., 10, 3833-3850, https://doi.org/10.5194/amt-10-3833-2017, https://doi.org/10.5194/amt-10-3833-2017, 2017
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